• Metal Parts Products Manufacturers at China

    Metal Parts Products —Stamping & CNC Machining Manufacturers

    Probe Test Function and Usage Classification

    Product Item: Probe Test Function and Usage Classification
    Category: Spring Probe
    Test pin, a probe used to test PCBA.
    The surface is gold plated and the probe has a high performance spring with an average life of 30,000 to 100,000 times.
     The famous manufacturers abroad are QA, IDI, UC, Semiprobe, ECT, INGUN, BT.
    Probe material: W, ReW, CU, A+
    1.  The main materials used are W, ReW, general elasticity, easy migration, sticky gold chips, need to be cleaned many times, wear and tear needle long, life is general.

    • PRODUCT DETAIL
    Test pin, a probe used to test PCBA.
    The surface is gold plated and the probe has a high performance spring with an average life of 30,000 to 100,000 times.
     The famous manufacturers abroad are QA, IDI, UC, Semiprobe, ECT, INGUN, BT.
    Probe material: W, ReW, CU, A+
    1.  The main materials used are W, ReW, general elasticity, easy migration, sticky gold chips, need to be cleaned many times, wear and tear needle long, life is general.
    2. A + material cleaning-free needle, this material has good elasticity, is not easy to offset in testing, and does not stick gold chips, no cleaning, so long life.
    Probe classification
    Probes can be classified according to electronic testing purposes:
    A, optical circuit board test probe:
    The board test and the open circuit and short circuit detection probes before the components are installed, most of the domestic probe products can replace the imported products;

    B. Online test probe:
    a detection probe after the component is mounted on the PCB circuit board; a detection probe after the component is mounted on the PCB circuit board;
    The core technology of high-end products is still in the hands of foreign companies. Some domestic probe products have been successfully developed and can replace imported probe products;

    C, microelectronic test probe:
    That is, wafer testing or chip IC detection probes, the core technology is still in the hands of foreign companies, domestic manufacturers are actively involved in research and development, but only a small part of successful production.

    Probe Test Function
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